Profile characterization

Details Profile characterization Profile characterization

2007-12-13

2010-12-28

Shechtman, Sean P (Department: 2121)

Data processing: generic control systems or specific application

Specific application, apparatus or process

Product assembly or manufacturing

C700S087000, C700S114000, C700S160000, C700S192000, C700S193000, C700S195000, C702S150000, C382S152000

Reexamination Certificate

active

07860601

ABSTRACT:
A system and method are disclosed for quickly characterizing the profile of a surface of a processed workpiece using a non-contact scanner, such as a laser scanner, in preparation for subsequent machining. The method determines the location of a plurality of features of a processed workpiece on a machine tool, and includes steps of reading a first list of approximate feature locations, defining a scan path based on the first list, scanning a profile of the workpiece along the scan path and calculating an actual location of each feature of the plurality of features based on the profile. The system and method are well suited to determine the location of features such as holes in welder header boxes.

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patent: WO 99/10136 (1999-03-01), None

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