X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Reexamination Certificate
2007-11-16
2009-11-03
Yun, Jurie (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Computerized tomography
C378S019000, C378S098800
Reexamination Certificate
active
07613274
ABSTRACT:
A diagnostic imaging system includes an x-ray source that emits a beam of x-ray energy toward an object to be imaged and an energy discriminating (ED) detector that receives the x-ray energy emitted by the x-ray energy source. The ED detector includes a first layer having a first thickness, wherein the first layer comprises a semiconductor configurable to operate in at least an integrating mode and a second layer having a second thickness greater than the first thickness, and configured to receive x-rays that pass through the first layer. The system further includes a data acquisition system (DAS) operably connected to the ED detector and a computer that is operably connected to the DAS. The computer is programmed to identify saturated data in the second layer and substitute the saturated data with non-saturated data from a corresponding pixel in the first layer.
REFERENCES:
patent: 4511799 (1985-04-01), Bjorkholm
patent: 5138167 (1992-08-01), Barnes
patent: 5218624 (1993-06-01), LeMay
patent: 5225980 (1993-07-01), Hsieh et al.
patent: 5228069 (1993-07-01), Arenson et al.
patent: 5262871 (1993-11-01), Wilder et al.
patent: 5376795 (1994-12-01), Hasegawa et al.
patent: 5400378 (1995-03-01), Toth
patent: 5548123 (1996-08-01), Perez-Mendez et al.
patent: 5789737 (1998-08-01), Street
patent: 6198790 (2001-03-01), Pflaum
patent: 6453008 (2002-09-01), Sakaguchi et al.
patent: 6953935 (2005-10-01), Hoffman
patent: 7092481 (2006-08-01), Hoffman
patent: 7127027 (2006-10-01), Hoffman
patent: 7209536 (2007-04-01), Walter et al.
patent: 7260174 (2007-08-01), Hoffman et al.
patent: 2002/0085664 (2002-07-01), Bromberg et al.
patent: 2002/0097320 (2002-07-01), Zalis
patent: 2003/0023163 (2003-01-01), Johnson et al.
patent: 2003/0031296 (2003-02-01), Hoheisel
patent: 2003/0113267 (2003-06-01), Knopp et al.
patent: 2003/0169847 (2003-09-01), Karellas et al.
patent: 2004/0136491 (2004-07-01), Iatrou et al.
patent: 2004/0202283 (2004-10-01), Okumura et al.
patent: 2004/0264627 (2004-12-01), Besson
patent: 2006/0109949 (2006-05-01), Tkaczyk et al.
patent: 2006/0109950 (2006-05-01), Arenson et al.
Rashid-Farrokhi et al., “Local Tomography in Fan-Beam Geometry Using Wavelets,” IEEE, 1996, 0-7803-3258-X/96, pp. 709-712.
Sellin et al., “Characterisation of charge transport in compound semiconductor detectors,” Radiation Imaging Group, Department of Physics, University of Surrey, Guildford, UK.
“Direct vs. Indirect Conversion,” Agfa.com, Dec. 1, 2006, http://www.agfa.com/en/he/knowledge—training/technology/direct—indirect—conversion/index.jsp.
Edling, “A pixel readout chip for medical X-ray imaging,” Department of Radiation Sciences, Uppsala Universitet, Uppsala, Sweden.
“High Energy Particle/X-Ray Detector,” Hamamatsu Photonics K.K., Solid State Division, Cat. No. KOTH0006E02, Nov. 2003, Hamamatsu City, Japan.
Du Yanfeng
Li Wen
Short Jonathan D.
Tkaczyk John Eric
Wu Xiaoye
General Electric Company
Patnode Patrick K.
Yun Jurie
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