Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2005-08-17
2009-02-17
Strege, John B (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S149000, C382S168000, C382S169000, C382S172000
Reexamination Certificate
active
07492942
ABSTRACT:
In an image defect inspection method and apparatus, which detects a gray level difference between the corresponding portions of two images, automatically sets a threshold value based on the distribution of the detected gray level difference, compares the detected gray level difference with the threshold value, and judges one or the other of the portions to be defective if the gray level difference is larger than the threshold value, provisions are made to reduce the occurrence of false defects when there is a brightness difference between the two images undergoing the comparison. In the image defect inspection method, the brightness difference between the two images is computed (S106), and the threshold value is determined in such a manner that the threshold value increases with the computed brightness difference (S107).
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Machine translation of JP 2004-177397.
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Patent Abstract of Japan, Publication No. 2004177397 A, Published on Jun. 24, 2004, in the name of Ishikawa.
Ishikawa Akio
Ueyama Shinji
Christie Parker & Hale LLP
Strege John B
Tokyo Seimitsu Co. Ltd.
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