Semiconductor memory device

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Synchronizing

Reexamination Certificate

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C327S149000

Reexamination Certificate

active

07629821

ABSTRACT:
A semiconductor memory device includes a phase comparator, a delay chain, a delay controller, a fine delay chain, a delay model, a locking state detector, and a fine delay controller. The phase comparator compares a phase of a reference clock with that of a feedback clock. The delay chain delays and outputs the reference clock. The delay controller controls a delay value of the delay chain in response to the comparison result of the phase comparator. The fine delay chain outputs a delay value of a clock outputted from the delay chain. The delay model delays a clock to a modeled delay value to provide a delayed clock as the feedback clock. The locking state detector generates a locking variation signal corresponding to a phase difference between the reference clock and the feedback clock. The fine delay controller controls a fine adjustment value of the fine delay chain.

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patent: 6518807 (2003-02-01), Cho
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patent: 7138845 (2006-11-01), Lin
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patent: 10-2003-0048657 (2003-06-01), None
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patent: WO 2005-083716 (2005-09-01), None
Notice of Allowance issued from Korean Intellectual Property Office on Aug. 13, 2008 with an English Translation.

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