Probe card layout

Details Probe card layout Probe card layout

2006-11-03

2009-08-11

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S758010

Reexamination Certificate

active

07573276

ABSTRACT:
Multi-touchdown, parallel test probe cards having probe elements arranged to provide greater than 99% efficiency during testing of a substrate having a plurality of die thereon, and methods of use.

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LaPedus, Mark,; “NAND test costs sour out of control,” EETimes, Jul. 21, 2006, 2 pages.

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