Probe card assembly with ZIF connectors

Details Probe card assembly with ZIF connectors Probe card assembly with ZIF connectors

2007-08-13

2009-12-29

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S757020

Reexamination Certificate

active

07639028

ABSTRACT:
This invention discloses a probe card assembly with adjustable ZIF connectors. The probe card assembly comprises a substrate, a plurality of ZIF connectors and a plurality of adjustable fastening means for assembling and disassembling the ZIF connectors on the substrate. The substrate is a disc-like plate, having a first surface, a second surface, a plurality of concave sections disposed on the second surface and a plurality of first through holes perpendicular to the first surface. The first through holes are circularly arranged toward the substrate center. Pairs of first contacts are provided on the first surface adjacent to both sides of first through holes. A plurality of terminals are protruded from the second surface of the substrate for contacting and testing the wafer. The ZIF connectors are also circularly arranged toward the substrate center. Each ZIF connector has parallelly arranged second through holes from the top to the bottom of the connector and pairs of contact terminals for contacting the first contacts of the substrate. The adjustable fastening means are disposed from the concave section through the first and second through holes to assembling and disassembling the ZIF connectors on the first surface of the substrate.

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