Electricity: measuring and testing – Particle precession resonance – Spectrometer components
Reexamination Certificate
2007-06-04
2009-10-27
Shrivastav, Brj B. (Department: 2831)
Electricity: measuring and testing
Particle precession resonance
Spectrometer components
C324S318000, C324S315000, C324S307000
Reexamination Certificate
active
07609064
ABSTRACT:
A probe for a nuclear magnetic resonance apparatus comprises: a transmission coil for irradiating a sample with a high-frequency electromagnetic wave; and a receiving coil for detecting a nuclear magnetic resonance signal emitted by the sample, wherein a selector switch is disposed to the transmission coil to reduce the deterioration of sensitivity of the receiving coil by switching the resonance state of the transmission circuit between during irradiation and during detection, even if an electromagnetic coupling remains between transmission and reception.
REFERENCES:
patent: 3430128 (1969-02-01), Lovins
patent: 4535291 (1985-08-01), Lee et al.
patent: 4769602 (1988-09-01), Vinegar et al.
patent: 4816962 (1989-03-01), Yamada et al.
patent: 5276399 (1994-01-01), Kasten et al.
patent: 5650903 (1997-07-01), Gross et al.
patent: 5835995 (1998-11-01), Macovski et al.
patent: 5898306 (1999-04-01), Liu et al.
patent: 6201395 (2001-03-01), Stanley
patent: 6414488 (2002-07-01), Chmielewski
patent: 6900638 (2005-05-01), Yair et al.
patent: 7081753 (2006-07-01), Mullen et al.
patent: 7180291 (2007-02-01), Chmielewski et al.
patent: 7190165 (2007-03-01), Hammond et al.
patent: 7221162 (2007-05-01), Feiweier et al.
patent: 7227360 (2007-06-01), Jevtic et al.
patent: 7265549 (2007-09-01), Alvarez et al.
patent: 7265550 (2007-09-01), Laubacher et al.
patent: 7279896 (2007-10-01), Alvarez et al.
patent: 7279897 (2007-10-01), Alvarez et al.
patent: 7332910 (2008-02-01), Laubacher et al.
patent: 7388377 (2008-06-01), Alvarez et al.
patent: 2005/0140369 (2005-06-01), Feiweier et al.
patent: 2005/0189943 (2005-09-01), Hammond et al.
patent: 2005/0248345 (2005-11-01), Alvarez et al.
patent: 2005/0258831 (2005-11-01), Alvarez et al.
patent: 2005/0264289 (2005-12-01), Alvarez et al.
patent: 2006/0012371 (2006-01-01), Laubacher et al.
patent: 2006/0017438 (2006-01-01), Mullen et al.
patent: 2006/0033497 (2006-02-01), Chmielewski et al.
patent: 2006/0119357 (2006-06-01), Alvarez et al.
patent: 2006/0158187 (2006-07-01), Jevtic et al.
patent: 2007/0176600 (2007-08-01), Laubacher et al.
patent: 2008/0061786 (2008-03-01), Fukuda et al.
patent: 2008/0129291 (2008-06-01), Schiano et al.
patent: 04-015904 (1992-02-01), None
patent: 2002-207072 (2002-07-01), None
Japanese Office Action issued in corresponding Japanese Patent Application No. 2006-155971 on Sep. 9, 2008.
Fukuda Yuzo
Okada Michiya
Saitoh Kazuo
Yamamoto Hiroyuki
Antonelli, Terry Stout & Kraus, LLP.
Fetzner Tiffany A
Hitachi , Ltd.
Shrivastav Brj B.
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