Electrical contact device of probe card

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Details

C029S846000, C216S011000, C324S754090

Reexamination Certificate

active

07579857

ABSTRACT:
An electrical contact device of a probe card includes a base and probes on the base. The base has a top side with a cavity thereon, and the cavity has sidewalls connected to the top side. Anchored portion are provided on the sidewalls of the cavity. Each of the probes has a first end and a second end, wherein the first end is connected to the anchored portion, and the second end is extended toward the cavity respectively.

REFERENCES:
patent: 5923178 (1999-07-01), Higgins et al.
patent: 6504388 (2003-01-01), Comulada et al.
patent: 6967493 (2005-11-01), Mori et al.
patent: 7265562 (2007-09-01), Chen et al.

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