System and method of measuring probe float

Details System and method of measuring probe float System and method of measuring probe float

2004-03-15

2009-12-15

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090

Reexamination Certificate

active

07633306

ABSTRACT:
A system and method allow accurate calculation of probe float through optical free-hanging and electrical planarity measurement techniques. In accordance with an examplary embodiment, probe float may be determined by acquiring a free-hanging planarity measurement, obtaining a first electrical contact planarity measurement, and calculating probe float using results of the acquiring and the obtaining operations.

REFERENCES:
patent: 4195259 (1980-03-01), Reid et al.
patent: 4201939 (1980-05-01), Lee et al.
patent: 5861759 (1999-01-01), Bialobrodski
patent: 6118894 (2000-09-01), Schwartz
patent: 6420892 (2002-07-01), Krivy
patent: 6710798 (2004-03-01), Hershel et al.
patent: 6870382 (2005-03-01), Harris
patent: 2014315 (1979-08-01), None
patent: 2368912 (2002-05-01), None
patent: WO 2004083873 (2004-09-01), None

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