Method for the automatic parameterization of measuring systems

Details Method for the automatic parameterization of measuring systems Method for the automatic parameterization of measuring systems

2006-11-15

2009-10-13

Nguyen, Sang (Department: 2886)

Optics: measuring and testing

Shape or surface configuration

C356S625000, C356S003070, C382S154000, C250S559050

Reexamination Certificate

active

07602505

ABSTRACT:
A method for the automatic parameterization of measuring systems for the measurement of objects transported by means of a transport device, in particular volume measurement systems, wherein at least one image, which is at least one-dimensional and comprises picture elements, of a test object known at least in part to the measuring system with respect to its dimensions and located in the measuring zone of the measuring system is detected by at least one sensor for electromagnetic radiation, in particular a laser scanner, and the system parameters required for the measurement of the objects are determined from the image and the known dimensions of the test object.

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