Method and apparatus for multiple scan rate swept wavelength...

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system

Reexamination Certificate

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C250S221000

Reexamination Certificate

active

07573021

ABSTRACT:
The invention relates to optical sensor measurement methods that use a swept wavelength optical source to determine wavelength shift as well as to optical sensor systems that embody and employ these methods. A variable scan rate swept optical source is used to determine the optical path length from the optical interrogator to the optical sensors being measured. This data can then be used as desired or needed in implementing the sensor or making sensor measurements. In particular the data can be used in the optical sensor system to compensate for potential measurement errors due to the finite speed of light in the optical medium interconnecting optical sensors under test.

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