Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2007-04-16
2009-08-04
Chawan, Sheela C (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S146000, C348S126000, C250S559340
Reexamination Certificate
active
07570798
ABSTRACT:
An apparatus for three dimensional inspection of an electronic part which has a camera and illuminator for imaging a first view of the electronic part. An optical element is positioned to reflect a different view of the electronic part into the camera, and the camera thus provides an image of the electronic part having differing views of the electronic part. An image processor applies calculations on the differing views to calculate a three dimensional position of at least one portion of the electronic part.
REFERENCES:
patent: 2007/0183646 (2007-08-01), Beaty et al.
Final Decision,Scanner Technologies Corporationv.ICOS Vision Systems Corporation N.V., Civil Action Nos. 2007-1399 and 2008-1081, United States Court of Appeals for the Federal Circuit—Jun. 19, 2008.
Opinion,Scanner Technologies Corp.v.ICOS Vision Systems, N.V., No. 1:00-cv-04992-DC (S.D.N.Y. 2007), appeal docketed, No. 2007-1399 (Fed. Cir. Jun. 22, 2007).
Final Judgment,Scanner Technologies Corp.v.ICOS Vision Systems, N.V., No. 1:00-cv-04992-DC (S.D.N.Y. 2007), appeal docketed, No. 2007-1399 (Fed. Cir. Jun. 22, 2007).
Notice of Appeal,Scanner Technologies Corp.v.ICOS Vision Systems, N.V., No. 00-Civ.-4992, (S.D.N.Y. 2007), appeal docketed, No. 2007-1399 (Fed. Cir. Jun. 22, 2007).
Docketing Statement,Scanner Technologies Corp.v.ICOS Vision Systems, N.V., No. 1:00-cv-04992-DC (S.D.N.Y. 2007), appeal docketed, No. 2007-1399 (Fed. Cir. Jun. 22, 2007).
Beaty Elwin M.
Mork David P.
Chawan Sheela C
The Marbury Law Group PLLC
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