Image analysis – Pattern recognition
Reexamination Certificate
2007-03-20
2009-11-10
Bhatnagar, Anand (Department: 2624)
Image analysis
Pattern recognition
C707S793000
Reexamination Certificate
active
07616816
ABSTRACT:
The present invention provides a virtual data collection system and method that provides an image analyst with full-control of the image, including the ability to retrieve and reorganize information from an existing video database of images. The system provides for the search and retrieval of information from previously collected images, and reorganize them to meet new or revised mission objectives. The system also enables quick access of the “right” information through virtual data collection from the existing video database.
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Bhatnagar Anand
Lowenstein & Sandler PC
Sarnoff Corporation
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