Surface inspection method and apparatus

Details Surface inspection method and apparatus Surface inspection method and apparatus

2005-02-09

2009-11-10

Ahmed, Samir A (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C348S125000

Reexamination Certificate

active

07616803

ABSTRACT:
There have been disclosed a surface inspection method and a surface inspection apparatus for inspecting the surface of an article, the surface being almost flat and continuous and having non-flat parts with convex shapes and concave shapes provided based on specifications, capable of inspecting for defective parts in the non-flat parts without detecting the non-flat parts as defective parts. The surface inspection apparatus comprises an image pickup device, a correction data calculation unit for calculating non-flat part correction data for making the image of the non-flat part into one equivalent to the image of the flat part based on the difference between the image of the non-flat part and the image of the flat part, a non-flat correction unit for correcting the image of the non-flat part based on the non-flat part correction data, and a defect detection unit for detecting defects on the article surface by processing the image of the article surface after correcting the image of the non-flat part.

REFERENCES:
patent: 4972493 (1990-11-01), Chemaly
patent: 5379347 (1995-01-01), Kato et al.
patent: 6295374 (2001-09-01), Robinson et al.
patent: 6-249792 (1994-09-01), None
patent: 6-76849 (1994-10-01), None
patent: 10-103938 (1998-04-01), None
patent: 2000-47369 (2000-02-01), None
patent: 2000-171403 (2000-06-01), None

Affiliated with

Also associated with

Rating

Surface inspection method and apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Surface inspection method and apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Surface inspection method and apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4110375