Apparatus for accurate and efficient quality and reliability...

Electricity: magnetically operated switches – magnets – and electr – Electromagnetically actuated switches – Polarity-responsive

Reexamination Certificate

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Details

C200S181000

Reexamination Certificate

active

07602265

ABSTRACT:
The present invention provides multiple test structures for performing reliability and qualification tests on MEMS switch devices. A Test structure for contact and gap characteristic measurements is employed having a serpentine layout simulates rows of upper and lower actuation electrodes. A cascaded switch chain test is used to monitor process defects with large sample sizes. A ring oscillator is used to measure switch speed and switch lifetime. A resistor ladder test structure is configured having each resistor in series with a switch to be tested, and having each switch-resistor pair electrically connected in parallel. Serial/parallel test structures are proposed with MEMS switches working in tandem with switches of established technology. A shift register is used to monitor the open and close state of the MEMS switches. Pull-in voltage, drop-out voltage, activation leakage current, and switch lifetime measurements are performed using the shift register.

REFERENCES:
patent: 6016092 (2000-01-01), Qiu et al.
patent: 6440767 (2002-08-01), Loo et al.
patent: 6624720 (2003-09-01), Allison et al.
patent: 6888420 (2005-05-01), Schaffner et al.

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