Registers – Coded record sensors – Particular sensor structure
Reexamination Certificate
2007-02-27
2009-08-11
Kim, Ahshik (Department: 2876)
Registers
Coded record sensors
Particular sensor structure
C235S462010, C235S462090, C235S462240, C235S462420
Reexamination Certificate
active
07571859
ABSTRACT:
A digital image capturing and processing system comprising a plurality of coplanar illumination and imaging subsystem for producing a plurality of coplanar linear illumination and imaging planes which intersect within a 3D imaging volume defined relative to an imaging window. The system further includes a global object motion detection subsystem for detecting the motion of objects moving through the 3D imaging volume, and a global control subsystem for controlling the state of operations within each coplanar illumination and imaging station during system operation. Each coplanar illumination and imaging subsystem has an object detection state and a code symbol reading state of operation, and includes an array of planar illumination modules (PLIMs) for producing at least one substantially planar illumination beam (PLIB), and a linear image detection array having a field of view (FOV) on the linear image detection array and extending in substantially the same plane as the PLIB, to provide a coplanar illumination and imaging plane (PLIB/FOV) that is projected through the 3D imaging volume, for capturing linear (1D) digital images of an object passing therethrough, for subsequent processing and recognition of information graphically represented in the linear digital images. When the global object motion detection subsystem automatically detects the motion of an object passing through at least a portion of the 3D imaging volume, the global control subsystem manages the state of operation of each coplanar illumination and imaging station, e.g. by driving ore or more of coplanar illumination and imaging subsystems into the code symbol reading state of operation.
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Good Timothy
Knowles C. Harry
Xian Tao
Zhu Xiaoxun
Kim Ahshik
Metrologic Instruments Inc.
Perkowski Esq. P.C. Thomas J.
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