Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-10-26
2009-06-16
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S059000, C702S108000, C702S109000, C702S110000, C702S182000, C702S185000, C324S612000, C324S615000, C714S025000, C714S032000
Reexamination Certificate
active
07548820
ABSTRACT:
One embodiment of the present invention provides a system that facilitates high-sensitivity detection of an anomaly in telemetry data from an electronic system using a telemetric impulsional response fingerprint of the telemetry data. During operation, the system applies a sudden impulse step change to one or more operational parameters of the electronic system during operation. Next, the system generates a three-dimensional (3D) telemetric impulsional response fingerprint (TIRF) surface from a dynamic response in the telemetry data to the sudden impulse step change. The system then determines from the 3D TIRF surface whether the telemetry data contains an anomaly.
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Bougaev Anton A.
Gross Kenny C.
Urmanov Aleksey M.
Henson Mi'schita'
Park Vaughan & Fleming LLP
Raymond Edward
Sun Microsystems Inc.
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