Droplet shape measuring method and apparatus

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S239800

Reexamination Certificate

active

07486403

ABSTRACT:
In order to accurately measure a shape feature of a minute droplet arranged on a substrate by a simple method, with respect to the droplet, the substrate is perpendicularly irradiated with laser light to cause diffracted light fluxes generated during passage of the laser light through the droplet to interfere with each other, so that a diffraction pattern is obtained. The diffraction pattern formed on a screen of a detector as an image is picked up by an image pickup apparatus. The shape feature of the droplet is measured by using the resultant diffraction pattern and a refractive index of the droplet.

REFERENCES:
patent: 4842408 (1989-06-01), Yoshii et al.
patent: 5037202 (1991-08-01), Batchelder et al.
patent: 5107112 (1992-04-01), Yanagisawa et al.
patent: 5220555 (1993-06-01), Yanagisawa et al.
patent: 5299184 (1994-03-01), Yamano et al.
patent: 5329122 (1994-07-01), Sakai et al.
patent: 5329513 (1994-07-01), Nose et al.
patent: 5371727 (1994-12-01), Shido et al.
patent: 5414260 (1995-05-01), Takimoto et al.
patent: 5485451 (1996-01-01), Yamano et al.
patent: 5526334 (1996-06-01), Yamano et al.
patent: 5535018 (1996-07-01), Yamano et al.
patent: 5581364 (1996-12-01), Hatanaka et al.
patent: 5604591 (1997-02-01), Kitagawa
patent: 5793040 (1998-08-01), Oguchi et al.
patent: 5831961 (1998-11-01), Sakai et al.
patent: 5835211 (1998-11-01), Wells et al.
patent: 5870189 (1999-02-01), Uesugi et al.
patent: 2005/0041041 (2005-02-01), Sakai
patent: 8-94444 (1996-04-01), None
patent: 2001-41724 (2001-02-01), None
patent: 2002-277216 (2002-09-01), None
patent: 2005300488 (2005-10-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Droplet shape measuring method and apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Droplet shape measuring method and apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Droplet shape measuring method and apparatus will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4103185

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.