Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2007-05-21
2009-12-15
Strege, John B (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S141000, C382S154000, C382S287000, C356S401000
Reexamination Certificate
active
07634128
ABSTRACT:
A stereoscopic three-dimensional optical metrology system and method accurately measure the location of physical features on a test article in a manner that is fast and robust to surface contour discontinuities. Disclosed embodiments may image a test article from two or more perspectives through a substantially transparent fiducial plate bearing a fiducial marking; camera viewing angles and apparent relative distances between a feature on a test article and one or more fiducials may enable accurate calculation of feature position.
REFERENCES:
patent: 5537204 (1996-07-01), Woodhouse
patent: 6064756 (2000-05-01), Beaty et al.
patent: 6134975 (2000-10-01), Keil
patent: 6377701 (2002-04-01), Ohki
patent: 6728582 (2004-04-01), Wallack
patent: 2004/0233461 (2004-11-01), Armstrong et al.
Kraft Raymond H.
Snow Donald B.
Strom John T.
Dicke Billig & Czaja, PLLC
Rudolph Technologies, Inc.
Strege John B
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