Calibration control for pin electronics of automatic testing...

Details Calibration control for pin electronics of automatic testing... Calibration control for pin electronics of automatic testing...

2005-12-07

2009-02-10

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

Reexamination Certificate

active

07489123

ABSTRACT:
An integrated circuit for automatic calibration control of pin electronics is disclosed. The integrated circuit includes a substrate, and both pin electronics and a calibration circuit integral with the substrate. The calibration circuit is dedicated to a single channel of automatic testing equipment for a single pin of a device under test. Each sub-circuit of the pin electronics may include a replica output. The replica output is electrically coupled to the calibration circuit. The calibration circuit may include a multiplexor for receiving each of the replica outputs from the sub-circuits, such as a comparator, load and a driver, and for selectively switching between the replica outputs to determine calibration parameters for one or more levels of the sub-circuit. The calibration circuit includes a state machine capable of determining calibration parameters including offset and gain. After determining the calibration parameters, the state machine can compensate the one or more levels for each sub-circuit of the pin electronics based upon the calibration parameters.

REFERENCES:
patent: 4517512 (1985-05-01), Petrich et al.
patent: 5200696 (1993-04-01), Menis et al.
patent: 5428297 (1995-06-01), Grace et al.
Gasbarro, et al. “Integrated Pin Electronics for VLSI Functional Testers,”IEEE Journal of Solid-State Circuits, vol. 24, No. 2, Apr. 1989, pp. 331-337.

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