Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate
2007-04-17
2009-10-06
Tang, Minh N (Department: 2829)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
C324S763010, C324S765010
Reexamination Certificate
active
07598731
ABSTRACT:
Systems and methods for adjusting threshold voltage. A threshold voltage of a transistor of an integrated circuit is measured. A bias voltage, which when applied to a body well of the transistor corrects a difference between the threshold voltage and a desired threshold voltage for the transistor, is determined. The bias voltage is encoded into non-volatile storage on the integrated circuit. The non-volatile storage can be digital and/or analog.
REFERENCES:
patent: 5086501 (1992-02-01), DeLuca et al.
patent: 5167024 (1992-11-01), Smith et al.
patent: 5201059 (1993-04-01), Nguyen
patent: 5204863 (1993-04-01), Saint-Joigny et al.
patent: 5218704 (1993-06-01), Watts, Jr. et al.
patent: 5230055 (1993-07-01), Katz et al.
patent: 5239652 (1993-08-01), Seibert et al.
patent: 5422591 (1995-06-01), Rastegar et al.
patent: 5422806 (1995-06-01), Chen et al.
patent: 5440520 (1995-08-01), Schutz et al.
patent: 5461266 (1995-10-01), Koreeda et al.
patent: 5502838 (1996-03-01), Kikinis
patent: 5511203 (1996-04-01), Wisor et al.
patent: 5519309 (1996-05-01), Smith
patent: 5560020 (1996-09-01), Nakatani et al.
patent: 5592173 (1997-01-01), Lau et al.
patent: 5610533 (1997-03-01), Arimoto et al.
patent: 5682093 (1997-10-01), Kivela
patent: 5692204 (1997-11-01), Rawson et al.
patent: 5717319 (1998-02-01), Jokinen
patent: 5719800 (1998-02-01), Mittal et al.
patent: 5727208 (1998-03-01), Brown
patent: 5745375 (1998-04-01), Reinhardt et al.
patent: 5752011 (1998-05-01), Thomas et al.
patent: 5754869 (1998-05-01), Holzhammer et al.
patent: 5757171 (1998-05-01), Babcock
patent: 5778237 (1998-07-01), Yamamoto et al.
patent: 5812860 (1998-09-01), Horden et al.
patent: 5815724 (1998-09-01), Mates
patent: 5825674 (1998-10-01), Jackson
patent: 5848281 (1998-12-01), Smalley et al.
patent: 5880620 (1999-03-01), Gitlin et al.
patent: 5884049 (1999-03-01), Atkinson
patent: 5894577 (1999-04-01), MacDonald et al.
patent: 5923545 (1999-07-01), Nguyen
patent: 5933649 (1999-08-01), Lim et al.
patent: 5940785 (1999-08-01), Georgiou et al.
patent: 5940786 (1999-08-01), Steeby
patent: 5973526 (1999-10-01), Dabral
patent: 5974557 (1999-10-01), Thomas et al.
patent: 5996083 (1999-11-01), Gupta et al.
patent: 5996084 (1999-11-01), Watts
patent: 6035407 (2000-03-01), Gebara et al.
patent: 6047248 (2000-04-01), Georgiou et al.
patent: 6048746 (2000-04-01), Burr
patent: 6055655 (2000-04-01), Momohara
patent: 6078319 (2000-06-01), Bril et al.
patent: 6087892 (2000-07-01), Burr
patent: 6091283 (2000-07-01), Murgula et al.
patent: 6097242 (2000-08-01), Forbes et al.
patent: 6118306 (2000-09-01), Orton et al.
patent: 6119241 (2000-09-01), Michail et al.
patent: 6157092 (2000-12-01), Hofmann
patent: 6202104 (2001-03-01), Ober
patent: 6216235 (2001-04-01), Thomas et al.
patent: 6218708 (2001-04-01), Burr
patent: 6218892 (2001-04-01), Soumyanath et al.
patent: 6218895 (2001-04-01), De et al.
patent: 6232793 (2001-05-01), Arimoto et al.
patent: 6232827 (2001-05-01), De et al.
patent: 6272642 (2001-08-01), Pole, II et al.
patent: 6279048 (2001-08-01), Fadavi-Ardekani et al.
patent: 6303444 (2001-10-01), Burr
patent: 6304824 (2001-10-01), Bausch et al.
patent: 6311287 (2001-10-01), Dischler et al.
patent: 6314522 (2001-11-01), Chu et al.
patent: 6341087 (2002-01-01), Kunikiyo
patent: 6345363 (2002-02-01), Levy-Kendler
patent: 6347379 (2002-02-01), Dai et al.
patent: 6378081 (2002-04-01), Hammond
patent: 6388432 (2002-05-01), Uchida
patent: 6392467 (2002-05-01), Oowaki et al.
patent: 6411156 (2002-06-01), Borkar et al.
patent: 6415388 (2002-07-01), Browning et al.
patent: 6425086 (2002-07-01), Clark et al.
patent: 6427211 (2002-07-01), Watts, Jr.
patent: 6442746 (2002-08-01), James et al.
patent: 6456157 (2002-09-01), Forbes et al.
patent: 6457135 (2002-09-01), Cooper
patent: 6466077 (2002-10-01), Miyazaki et al.
patent: 6477654 (2002-11-01), Dean et al.
patent: 6484265 (2002-11-01), Borkar et al.
patent: 6487668 (2002-11-01), Thomas et al.
patent: 6489224 (2002-12-01), Burr
patent: 6510400 (2003-01-01), Moriyama
patent: 6510525 (2003-01-01), Nookala et al.
patent: 6513124 (2003-01-01), Furuichi et al.
patent: 6518826 (2003-02-01), Zhang
patent: 6519706 (2003-02-01), Ogoro
patent: 6574739 (2003-06-01), Kung et al.
patent: 6600346 (2003-07-01), Macaluso
patent: 6614301 (2003-09-01), Casper et al.
patent: 6621325 (2003-09-01), Hart et al.
patent: 6653890 (2003-11-01), Ono et al.
patent: 6731157 (2004-05-01), Fulkerson
patent: 6777978 (2004-08-01), Hart et al.
patent: 6784722 (2004-08-01), Tang et al.
patent: 6792379 (2004-09-01), Ando
patent: 6794630 (2004-09-01), Keshavarzi et al.
patent: 6812758 (2004-11-01), Gauthier et al.
patent: 6847252 (2005-01-01), Ono et al.
patent: 6858897 (2005-02-01), Chen
patent: 6864539 (2005-03-01), Ishibashi, et al.
patent: 6912155 (2005-06-01), Sakurai et al.
patent: 6967522 (2005-11-01), Chandrakasan et al.
patent: 6992508 (2006-01-01), Chow
patent: 7129745 (2006-10-01), Lewis, et al.
patent: 7334198 (2008-02-01), Ditzel, et al.
patent: 7348827 (2008-03-01), Rahim, et al.
patent: 2002/0002689 (2002-01-01), Yeh
patent: 2002/0026597 (2002-02-01), Dai et al.
patent: 2002/0029352 (2002-03-01), Borkar et al.
patent: 2002/0030533 (2002-03-01), De et al.
patent: 2002/0033510 (2002-03-01), Tomita
patent: 2002/0073348 (2002-06-01), Tani
patent: 2002/0083356 (2002-06-01), Dai
patent: 2002/0087896 (2002-07-01), Cline et al.
patent: 2002/0113628 (2002-08-01), Ajit
patent: 2002/0116650 (2002-08-01), Halepete et al.
patent: 2002/0138778 (2002-09-01), Cole et al.
patent: 2002/0140494 (2002-10-01), Thomas et al.
patent: 2002/0178390 (2002-11-01), Lee
patent: 2002/0194509 (2002-12-01), Plante et al.
patent: 2003/0005378 (2003-01-01), Tschanz et al.
patent: 2003/0021161 (2003-01-01), Fifield et al.
patent: 2003/0037068 (2003-02-01), Thomas et al.
patent: 2003/0038876 (2003-02-01), Nagashima
patent: 2003/0063513 (2003-04-01), Tsunoda et al.
patent: 2003/0065960 (2003-04-01), Rusu et al.
patent: 2003/0074591 (2003-04-01), McClendon et al.
patent: 2003/0080802 (2003-05-01), Ono et al.
patent: 2003/0132735 (2003-07-01), Fulkerson
patent: 2003/0149988 (2003-08-01), Ellis et al.
patent: 2004/0014268 (2004-01-01), Ishibashi et al.
patent: 2004/0016977 (2004-01-01), Miyazaki et al.
patent: 2004/0021501 (2004-02-01), Das et al.
patent: 2004/0025061 (2004-02-01), Lawrence
patent: 2004/0073821 (2004-04-01), Naveh et al.
patent: 2004/0109354 (2004-06-01), Wang et al.
patent: 2004/0123170 (2004-06-01), Tschanz et al.
patent: 2004/0125644 (2004-07-01), Komatsuzaki
patent: 2004/0128631 (2004-07-01), Ditzel et al.
patent: 2004/0155696 (2004-08-01), Gauthier et al.
patent: 2004/0217372 (2004-11-01), Chen
patent: 2005/0160465 (2005-07-01), Walker
patent: 2005/0225376 (2005-10-01), Kin Law
patent: 2005/0237083 (2005-10-01), Bakker et al.
patent: 2005/0280437 (2005-12-01), Lewis et al.
patent: 2006/0157818 (2006-07-01), Williams et al.
patent: 2006/0223257 (2006-10-01), Williams et al.
patent: 0381021 (1990-01-01), None
patent: 0474963 (1991-04-01), None
patent: 0501655 (1992-02-01), None
patent: 409185589 (1997-07-01), None
patent: 0127728 (2001-04-01), None
“Wager Burn-In Isolation Circuit”; IBM Technical Disclosure Bulletin; IBM Corp. New York, US, vol. 32, No. 6B, Nov. 1, 1989, pp. 442-443; XP00073858 ISSN: 0018-8689 (The Whole Document).
Baker, K., et al.; “SHMOO Plotting: The Black Art of IC Testing”; IEEE Design & Test of Computers, IEEE vol. 14, No. 3; July 1, 1997, pp. 90-97, XP000793305 ISSN: 0740-7475 the whole documents.
Computer Software, Wikipedia; “http://en.wikipedia.org/wiki/Software”; retrieved on May 2, 2007.
Desai, et al.; “Sizing of Clock Distribution Networks for High Performance CPU Chips”; Digital Equipment Corporation, Hudson, MA, pp. 389-394, 1996.
Burr James B.
Masleid Robert Paul
LandOfFree
Systems and methods for adjusting threshold voltage does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Systems and methods for adjusting threshold voltage, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Systems and methods for adjusting threshold voltage will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4087594