Organic thin film transistors

Active solid-state devices (e.g. – transistors – solid-state diode – Organic semiconductor material

Reexamination Certificate

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Details

C257S347000, C257S352000, C257SE51006, C257SE51007, C257SE51029, C438S099000, C438S780000

Reexamination Certificate

active

07573063

ABSTRACT:
A thin film transistor having an improved gate dielectric layer is disclosed. The gate dielectric layer comprises a poly(4-vinylphenol-co-acrylonitrile) based polymer. The resulting gate dielectric layer has a high dielectric constant and can be crosslinked. Higher gate dielectric layer thicknesses can be used to prevent current leakage while still having a large capacitance for low operating voltages. Methods for producing such gate dielectric layers and/or thin film transistors comprising the same are also disclosed.

REFERENCES:
patent: 5304456 (1994-04-01), Ueda et al.
patent: 5372914 (1994-12-01), Naito et al.
patent: 6579690 (2003-06-01), Bonnecaze et al.
patent: 2003/0160230 (2003-08-01), Ong et al.
patent: 2006/0160251 (2006-07-01), Dyreklev et al.
patent: 2007/0138463 (2007-06-01), Herlogsson et al.
patent: 2008/0050747 (2008-02-01), Korlach et al.
patent: 2009/0026513 (2009-01-01), Johansson et al.

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