Active solid-state devices (e.g. – transistors – solid-state diode – Organic semiconductor material
Reexamination Certificate
2008-05-15
2009-08-11
Ngo, Ngan (Department: 2893)
Active solid-state devices (e.g., transistors, solid-state diode
Organic semiconductor material
C257S347000, C257S352000, C257SE51006, C257SE51007, C257SE51029, C438S099000, C438S780000
Reexamination Certificate
active
07573063
ABSTRACT:
A thin film transistor having an improved gate dielectric layer is disclosed. The gate dielectric layer comprises a poly(4-vinylphenol-co-acrylonitrile) based polymer. The resulting gate dielectric layer has a high dielectric constant and can be crosslinked. Higher gate dielectric layer thicknesses can be used to prevent current leakage while still having a large capacitance for low operating voltages. Methods for producing such gate dielectric layers and/or thin film transistors comprising the same are also disclosed.
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Li Yuning
Liu Ping
Ong Beng S.
Wu Yiliang
Fay Sharpe LLP
Ngo Ngan
Palazzo Eugene O.
Xerox Corporation
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