Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device
Reexamination Certificate
2007-06-28
2009-11-10
Mandala, Victor A (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
C257S002000, C257S003000, C257S004000, C257S005000, C257SE29002
Reexamination Certificate
active
07615769
ABSTRACT:
A nonvolatile memory device and a method for its fabrication may ensure uniform operating characteristics of ReRAM. The ReRam may include a laminated resistance layer that determines phase of ReRAM on an upper edge of a lower electrode for obtaining a stable threshold drive voltage level.
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Hynix / Semiconductor Inc.
Mandala Victor A
Marshall & Gerstein & Borun LLP
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