Semiconductor device having an improved wiring or electrode...

Active solid-state devices (e.g. – transistors – solid-state diode – Bipolar transistor structure – Plural non-isolated transistor structures in same structure

Reexamination Certificate

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C257S745000, C257S155000, C257S928000, C310S312000

Reexamination Certificate

active

07569911

ABSTRACT:
An ohmic electrode is formed by stacking a lower Ti layer, a diffusion preventing layer, an upper Ti layers and a metallic (Au) layer on a p-type GaAs layer. The diffusion preventing layer includes tantalum (Ta) or niobium (Nb). Thus, interdiffusion of Ga and As in the p-type GaAs layer and Au in the metallic layer can be prevented, and variation in resistivity of the ohmic electrode in a high-temperature, high-humidity environment can be suppressed.

REFERENCES:
patent: 4300149 (1981-11-01), Howard et al.
patent: 6365969 (2002-04-01), Yamaguchi et al.
patent: 6396854 (2002-05-01), Takagi
patent: 6610995 (2003-08-01), Nakamura et al.
patent: 7323783 (2008-01-01), Nakayama et al.
patent: 2005/0151255 (2005-07-01), Ando et al.
patent: 2005/0190416 (2005-09-01), Yoneda
patent: 2005/0274980 (2005-12-01), Miyoshi
patent: 56-37672 (1981-04-01), None
patent: 62-224083 (1987-10-01), None
patent: 2004-022773 (2004-01-01), None

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