Element analyzer exploiting a magneto-optic effect

Details Element analyzer exploiting a magneto-optic effect Element analyzer exploiting a magneto-optic effect

1977-09-29

1979-10-23

Evans, F. L.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrophotometer

356312, G01J 342

Patent

active

041719123

ABSTRACT:
In an element analyzer exploiting a magneto-optic effect, when a concentration of the element in a sample material to be detected is high, two peaks are produced in the wave form of the signal obtained during the measurement. The present invention provides a discriminating technique to indicate whether two peaks appear in the wave form of the signal, with the object of reducing the error produced in the element analysis exploiting a magneto-optic effect.

REFERENCES:
patent: 4035083 (1977-07-01), Woodriff et al.
Uchida et al., Oyo Buturi, vol. 44, No. 8, Aug. 1975, pp. 852 (16)-857 (21).

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