Loading hardware pattern memory in automatic test equipment for

Details Loading hardware pattern memory in automatic test equipment for Loading hardware pattern memory in automatic test equipment for

1995-12-15

1999-06-15

Nguyen, Hoa T.

Excavating

39518306, 39518401, 371 211, 371 221, G06F 1100

Patent

active

059130229

ABSTRACT:
A system for testing circuits includes a tester having a pattern memory for storing test vectors; an object database to store a persistent vector pattern object including a pattern of test vectors; and an object-oriented database management server process. The server process is a computer program configured to run on a server processor in communication with the object database. The server process and the tester operate together to obtain the vector pattern object from the object database and to load the pattern of test vectors from the object into the pattern memory. The tester can have a processor to run a database client process. The vector pattern object can include member functions to modify the vector pattern. In another aspect, the system includes a programmable tester that has a pattern memory to store test vectors; and a database server process on a computer in communication with an object database storing a copy of a pattern memory database object that includes a computer-readable representation of a state of the pattern memory. The tester can execute a client process to request a copy of the pattern memory database object. In one implementation, the pattern memory manager object includes the identity, location, and status of each pattern in the pattern memory of the tester.

REFERENCES:
patent: 4777355 (1988-10-01), Takahira
patent: 5157781 (1992-10-01), Harwood et al.
patent: 5521833 (1996-05-01), Lesch
Tinaztepe et al.; "OOP Comes to ATE"; Test & Measurement; Oct. 1992; Cahners Publishing Company.

Affiliated with

Also associated with

Rating

Loading hardware pattern memory in automatic test equipment for does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Loading hardware pattern memory in automatic test equipment for , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Loading hardware pattern memory in automatic test equipment for will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-408232