Method and apparatus for investigating a sample

Details Method and apparatus for investigating a sample Method and apparatus for investigating a sample

2004-08-20

2009-02-03

Hannaher, Constantine (Department: 2884)

Radiant energy

Invisible radiant energy responsive electric signalling

Infrared responsive

Reexamination Certificate

active

07485863

ABSTRACT:
Method and apparatus for irradiating a sample with Terhertz radiation and detecting non-specular radiation in order to characterise the internal structure of the sample. Terahertz radiation specularly reflected from the surface is minimised so that it does not mask the weaker signal originating from the internal structure of the sample.

REFERENCES:
patent: 4197457 (1980-04-01), Cheo
patent: 5623145 (1997-04-01), Nuss
patent: 5813987 (1998-09-01), Modell et al.
patent: 0 468 817 (1992-01-01), None
patent: 0 727 671 (1996-08-01), None
patent: 0 841 548 (1998-05-01), None
patent: 1 367 636 (1974-09-01), None
patent: 2 385 415 (2003-08-01), None
patent: WO 00/75641 (2000-12-01), None
patent: WO 01/48457 (2001-07-01), None

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