Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material
Reexamination Certificate
2005-09-06
2009-10-06
Parker, Kenneth A (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Non-single crystal, or recrystallized, semiconductor...
Amorphous semiconductor material
C257S072000
Reexamination Certificate
active
07598524
ABSTRACT:
A thin film transistor (TFT) is disclosed, and the thin film transistor comprises: a substrate, a gate electrode, a first adhesion layer, a gate insulting layer, a semiconductor layer, and a source electrode and a drain electrode. The gate electrode is formed on the substrate, and the gate electrode is made of silver. The first adhesion layer is formed between the substrate and the gate electrode. A gate insulating layer is formed on the gate electrode. The semiconductor layer is formed on the gate insulating layer. The source electrode and the drain electrode are formed on parts of the semiconductor layer. Accordingly, the reliable TFT is provided through having the Ag metal with low resistivity and good adhesion characteristics.
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Communication from the Chinese Patent Office dated Jul. 25, 2008 with regard to the counterpart Chinese Application 2005100667919.
Fang Kuo-Lung
Lee Chia-Sheng
Lin Han-Tu
Tsai Wen-Ching
Au Optronics Corporation
Ho Anthony
Parker Kenneth A
Rosenberg , Klein & Lee
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