Probe chip and probe card

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Reexamination Certificate

active

07545160

ABSTRACT:
The present invention provides a probe chip and a probe card in which when troubles such as breakage etc. occur in a probe of a contact portion of a probe card, the contact portion can be easily replaced with another one. In the probe card having a guide frame, a probe chip and a fixing jig, a second arm portion of a cantilever of the probe chip is abutted on a conductive path of a fixing jig such that the probe chip is held or pressed down and fixed to the guide frame with the second arm portion being elastically deformed.

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patent: 6809539 (2004-10-01), Wada et al.
patent: 6852968 (2005-02-01), Ouchi et al.
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patent: 6974712 (2005-12-01), Ouchi et al.
patent: 7061262 (2006-06-01), Mai
patent: 2002/0008530 (2002-01-01), Kim et al.
patent: 2004/0154165 (2004-08-01), Takoshima et al.
patent: 2006/0033521 (2006-02-01), Mai
patent: 2008/0191726 (2008-08-01), Ku et al.
patent: 8-64646 (1996-03-01), None
patent: 8-313557 (1996-11-01), None

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