Semiconductor device, method and apparatus for testing same,...

Details Semiconductor device, method and apparatus for testing same,... Semiconductor device, method and apparatus for testing same,...

2008-02-12

2009-08-11

Hollington, Jermele M (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07573280

ABSTRACT:
A semiconductor device wherein an electrode pad to be contacted a test probe for performing probe testing, a bonding area mark for defining a bonding area which performs wire boding on the electrode pad, and a probe area mark for defining a probe repair area for repairing or replacing the test probe for the electrode pad.

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Chinese Office Action dated Aug. 10, 2007, with English translation.

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