Facsimile and static presentation processing – Static presentation processing – Data corruption – power interruption – or print prevention
Reexamination Certificate
2004-10-28
2009-11-24
Poon, King Y (Department: 2625)
Facsimile and static presentation processing
Static presentation processing
Data corruption, power interruption, or print prevention
C358S001100, C358S001500, C358S001900, C358S001120, C358S001160, C358S001180, C358S504000, C347S009000, C347S012000, C347S013000, C347S019000, C347S047000, C356S319000, C356S402000, C356S419000, C399S301000, C707S793000, C714S001000, C714S002000
Reexamination Certificate
active
07623254
ABSTRACT:
A method for testing inkjets for defects in an inkjet device includes determining, based on the likelihood that one or more inkjets are defective, whether to perform an inkjet defect test, The method may also include, identifying, if it is determined to perform an inkjet defect test, which inkjets to test based on properties of the inkjets, the number of identified inkjets being less than a total number of inkjets in the inkjet device; and testing the identified inkjets for defects using an image sensor.
REFERENCES:
patent: 4255754 (1981-03-01), Crean et al.
patent: 4977459 (1990-12-01), Ebinuma et al.
patent: 5160938 (1992-11-01), Fargo et al.
patent: 5367326 (1994-11-01), Pond et al.
patent: 5389958 (1995-02-01), Bui et al.
patent: 5450111 (1995-09-01), Mutoh
patent: 5550956 (1996-08-01), Tadokoro
patent: 5600352 (1997-02-01), Knierim et al.
patent: 5627571 (1997-05-01), Anderson et al.
patent: 5721620 (1998-02-01), Arai et al.
patent: 5798773 (1998-08-01), Hiramatsu et al.
patent: 5815175 (1998-09-01), Seikel
patent: 5889534 (1999-03-01), Johnson et al.
patent: 5937145 (1999-08-01), Garboden et al.
patent: 6045206 (2000-04-01), Igval
patent: 6045210 (2000-04-01), Suzuki et al.
patent: 6106088 (2000-08-01), Wafler
patent: 6130682 (2000-10-01), Kohno et al.
patent: 6145981 (2000-11-01), Akahira et al.
patent: 6238112 (2001-05-01), Girones et al.
patent: 6273542 (2001-08-01), Couwenhoven et al.
patent: 6278469 (2001-08-01), Bland et al.
patent: 6371590 (2002-04-01), Hah
patent: 6447091 (2002-09-01), Calvo et al.
patent: 6460963 (2002-10-01), Endo
patent: 6481824 (2002-11-01), Hayakawa et al.
patent: 6511150 (2003-01-01), Yoda et al.
patent: 6533384 (2003-03-01), Vega et al.
patent: 6547365 (2003-04-01), Alberto et al.
patent: 6582051 (2003-06-01), Bruch et al.
patent: 6604807 (2003-08-01), Murcia et al.
patent: 6637853 (2003-10-01), Ahne et al.
patent: 6644772 (2003-11-01), Choi
patent: 6814422 (2004-11-01), Bruch et al.
patent: 6834927 (2004-12-01), Yashima et al.
patent: 6893106 (2005-05-01), Kuriyama et al.
patent: 7243270 (2007-07-01), Taniguchi et al.
patent: 7490918 (2009-02-01), Nagashima
patent: 2001/0011260 (2001-08-01), Skaanning et al.
patent: 2002/0141769 (2002-10-01), Phillips
U.S. Appl. No. 10/913,527, filed Sep. 30, 2004, Folkins et al.
Eklund Elliott A.
Folkins Jeffrey J.
Knierim David L.
Oliff & Berridg,e PLC
Poon King Y
Xerox Corporation
Zhu Richard Z
LandOfFree
Systems and methods for detecting inkjet defects does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Systems and methods for detecting inkjet defects, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Systems and methods for detecting inkjet defects will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4066097