Radiant energy – Ionic separation or analysis – Methods
Reexamination Certificate
2006-05-26
2009-11-10
Vanore, David A (Department: 2881)
Radiant energy
Ionic separation or analysis
Methods
C250S281000, C250S290000, C250S291000, C250S292000, C250S293000
Reexamination Certificate
active
07615742
ABSTRACT:
The invention relates to methods for the measurement of fragment ion spectra in ion trap mass spectrometers in which fragment ions below a cut-off mass cannot normally be measured. The invention consists in measuring mass spectra including light fragment ions by briefly conducting the collisionally induced fragmentation—which is always brought about by a large number of collisions—at an unusual high RF storage voltage, which produces collisions more energetically than by conventional fragmentation, and then switching the RF voltage to a low RF voltage in a fast but controlled procedure. In this way light fragment ions are produced by double cleavages from metastable fragment ions with a certain half-life time. Since the cut-off mass for the storage capability is proportional to the RF storage voltage, reducing the RF storage voltage means that the light fragment ions can also be kept and measured in the ion trap.
REFERENCES:
patent: 4686367 (1987-08-01), Louris et al.
patent: 4736101 (1988-04-01), Syka et al.
patent: 4818869 (1989-04-01), Weber-Grabau
patent: 5198665 (1993-03-01), Wells
patent: 5420425 (1995-05-01), Bier et al.
patent: 5466931 (1995-11-01), Kelley
patent: 5654542 (1997-08-01), Schubert et al.
patent: 5714755 (1998-02-01), Wells et al.
patent: 6147348 (2000-11-01), Quarmby et al.
patent: 6410913 (2002-06-01), Brekenfeld et al.
patent: 6852972 (2005-02-01), Baba et al.
patent: 6949743 (2005-09-01), Schwartz
patent: 7034293 (2006-04-01), Wells
patent: 7102129 (2006-09-01), Schwartz
patent: 7227137 (2007-06-01), Londry et al.
patent: 2002/0175280 (2002-11-01), Franzen
patent: 2003/0150988 (2003-08-01), Wells
patent: 2004/0079873 (2004-04-01), Bateman et al.
patent: 2004/0079880 (2004-04-01), Bateman et al.
patent: 2004/0119015 (2004-06-01), Hashimoto et al.
patent: 2005/0178963 (2005-08-01), Londry et al.
patent: 2005/0258362 (2005-11-01), Collings
patent: 2005/0263695 (2005-12-01), Syka
patent: 2005/0274887 (2005-12-01), Weiss et al.
patent: 2005/0274902 (2005-12-01), Weiss
patent: 2006/0054808 (2006-03-01), Schwartz
patent: 2006/0169884 (2006-08-01), Syka
patent: 2006/0192112 (2006-08-01), Mordehal
patent: 44 25 384 (1995-11-01), None
patent: 0 579 935 (1994-01-01), None
patent: 0 580 986 (1994-02-01), None
patent: 1 463 090 (2004-09-01), None
patent: 2 363 249 (2001-12-01), None
patent: WO 95/18669 (1995-07-01), None
patent: WO 2006/031896 (2006-03-01), None
Bruker Daltonik GmbH
Law Offices of Paul E. Kudirka
Logie Michael J
Vanore David A
LandOfFree
Measurement of light fragment ions with ion traps does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Measurement of light fragment ions with ion traps, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measurement of light fragment ions with ion traps will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4054171