Method for designing alternating phase shift masks

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C716S030000

Reexamination Certificate

active

07470489

ABSTRACT:
A method of designing an alternating phase shifting mask for projecting an image of an integrated circuit design having a plurality of spaced segments of critical dimension. The method initially identifies a phase universe boundary, such that the phase universe comprises a contiguous region of the integrated circuit layout wherein critical dimension segments within the phase universe are beyond a maximum phase interaction distance from any critical dimension segments outside the phase universe in accordance with predetermined design rules. The method then divides the phase universe into phase regions separated by the integrated circuit layout and any extensions of the critical dimension segments so that the phase regions are binary colorable within the phase universe.

REFERENCES:
patent: 5923566 (1999-07-01), Galan et al.
patent: 6277527 (2001-08-01), O'Grady et al.
patent: 6338922 (2002-01-01), Liebmann et al.
patent: 6609245 (2003-08-01), Liebmann et al.
patent: 2003/0093766 (2003-05-01), Liebmann et al.
patent: 2003/0101430 (2003-05-01), Liebmann et al.
patent: 2005/0287444 (2005-12-01), Graur et al.
U.S. Appl. No. 10/707,962, filed Jan. 28, 2004, Liebmann et al.
“Exposing the DUV SCAAM—75nm Imaging on the Cheap!”; Marc d. Levenson and Takeaki (Joe) Ebihara; M.D. Levenson Consulting, Saratoga, CA 95070; Proceedings of the SPIE vol. 4692; 2002; pp. 288-297, Jun. 2002.
“Lithography, resolution enhancement, Design for Manufacturability”; Lars Liebmann; IBM Microelectronics, Semiconductor Research and Development Center; Coauthored with Greg Northrop; James Culp; Leon Sigal; Arnold Barish; Carlos Fonseca and Juan-Antonio Carballo; 13 pages, Jun. 2002.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for designing alternating phase shift masks does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for designing alternating phase shift masks, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for designing alternating phase shift masks will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4050948

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.