System and method for measuring quality of baseline modeling...

Data processing: structural design – modeling – simulation – and em – Modeling by mathematical expression

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C703S007000, C701S059000, C700S029000, C700S030000, C700S031000, C702S184000

Reexamination Certificate

active

07457732

ABSTRACT:
System, method and computer product for baseline modeling a product or process. A service database contains process data. A preprocessor processes the data into a predetermined format. A baseline modeling component builds a baseline model from the preprocessed data, wherein the baseline model relates process performance variables as a function of process operating conditions.

REFERENCES:
patent: 4215412 (1980-07-01), Bernier et al.
patent: 5018069 (1991-05-01), Pettigrew
patent: 5050081 (1991-09-01), Abbott et al.
patent: 5075881 (1991-12-01), Blomberg et al.
patent: 5080458 (1992-01-01), Hockaday
patent: 5189606 (1993-02-01), Burns et al.
patent: 5197127 (1993-03-01), Waclawsky et al.
patent: 5408412 (1995-04-01), Hogg et al.
patent: 5687082 (1997-11-01), Rizzoni
patent: 5727128 (1998-03-01), Morrison
patent: 6003808 (1999-12-01), Nguyen et al.
patent: 6047593 (2000-04-01), Scher et al.
patent: 6067486 (2000-05-01), Aragones et al.
patent: 6125312 (2000-09-01), Nguyen et al.
patent: 6151582 (2000-11-01), Huang et al.
patent: 6216066 (2001-04-01), Goebel et al.
patent: 6223143 (2001-04-01), Weinstock et al.
patent: 6243696 (2001-06-01), Keeler et al.
patent: 6317654 (2001-11-01), Gleeson et al.
patent: 6408259 (2002-06-01), Goebel et al.
patent: 6473677 (2002-10-01), Hershey et al.
patent: 6487479 (2002-11-01), Nelson
patent: 6487490 (2002-11-01), Kamath et al.
patent: 6519575 (2003-02-01), Goebel
patent: 6591182 (2003-07-01), Cece et al.
patent: 6601015 (2003-07-01), Milvert et al.
patent: 6606580 (2003-08-01), Zedda et al.
patent: 6631384 (2003-10-01), Richman et al.
patent: 6799154 (2004-09-01), Aragones et al.
patent: 6832205 (2004-12-01), Aragones et al.
patent: 7031878 (2006-04-01), Cuddihy et al.
patent: 2001/0032109 (2001-10-01), Gonyea et al.
patent: 2002/0173897 (2002-11-01), Leamy et al.
patent: 2003/0034995 (2003-02-01), Osborn et al.
patent: 2003/0036891 (2003-02-01), Aragones et al.
patent: 2003/0045992 (2003-03-01), Humerickhouse et al.
patent: 2004/0172228 (2004-09-01), Aragones
patent: 1146468 (2001-10-01), None
patent: 1160712 (2001-12-01), None
U.S. Appl. No. 10/707,655, Aragones.
U.S. Appl. No. 10/707,656, Aragones.
“Multiple Regression,” http://www2.chass.nscu.edu/garson/pa765/regress.htm, pp. 1-27 (printed Oct. 22, 2003).
“Introduction to Regression Analysis,” http://www.nlreg.com/intro.htm, pp. 1-3 (printed Oct. 22, 2003).
R. A. Johnson et al., “Multivariate Linear Regression Models,” Applied Multivariate Statistical Analysis, Chapter 7, 1988, pp. 273-339.
B. Curtis et al., “Process Modeling,” Association for Computing Machinery, Communications of the ACM, Sep. 1992, pp. 75-90.
M. A. Schuldt et al., “Alternative Approaches to Baseline Estimation Using Calibrated Simulations,” ASHRAE Transactions, 1998, pp. 871-879.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

System and method for measuring quality of baseline modeling... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for measuring quality of baseline modeling..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for measuring quality of baseline modeling... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4029452

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.