Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2006-07-14
2008-12-02
Nguyen, Dang T (Department: 2824)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185170, C365S185140
Reexamination Certificate
active
07460405
ABSTRACT:
Data is written to a nonvolatile memory device having a memory region of four bits or larger in one memory cell sandwiched by a source and a drain with an improved accuracy. The nonvolatile memory device100includes four control gates114to117provided between a first and a second impurity-diffused regions106aand160bthat are provided separately from the semiconductor substrate, and a memory cell including memory regions106ato106dthat are counterpart of the control gates. A method for controlling the nonvolatile memory device100includes classifying the four control gates114to100into two groups of right and left sides, and then, applying a lower voltage to an impurity-diffused region that is further from a target memory region for injecting an electron and applying a higher voltage to an impurity-diffused region that is closer the target memory region, and moreover applying a higher voltage, the higher voltage being higher than voltages applied to other control gates.
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NEC Electronics Corporation
Nguyen Dang T
Young & Thompson
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