Temperature detecting semiconductor device

Oscillators – With device responsive to external physical condition – Temperature or light responsive

Reexamination Certificate

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Details

C331S057000

Reexamination Certificate

active

07459983

ABSTRACT:
There is provided a technique which is capable of detecting a temperature of a semiconductor device with high precision. A temperature detection circuit detecting a temperature of a semiconductor device includes a first short-cycle oscillator generating a first clock signal having positive temperature characteristics with respect to a frequency, a second short-cycle oscillator generating a second clock signal having negative temperature characteristics with respect to the frequency, and a temperature signal generation unit generating a temperature signal which is varied according to the temperature of the semiconductor device based on the first and second clock signals.

REFERENCES:
patent: 5994970 (1999-11-01), Cole et al.
patent: 52146723 (1977-12-01), None
patent: 58-35431 (1983-03-01), None
patent: 011305 (1989-01-01), None
patent: 5-307882 (1993-11-01), None
patent: 9-223395 (1997-08-01), None
patent: 10-239097 (1998-09-01), None
patent: 2000-55742 (2000-02-01), None
patent: 2000-269417 (2000-09-01), None

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