Method and system for the optical inspection of contact...

Details Method and system for the optical inspection of contact... Method and system for the optical inspection of contact...

2006-04-06

2008-11-11

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S756010, C324S758010

Reexamination Certificate

active

07449903

ABSTRACT:
A system and method is provided that reliably determines the position of contact needle tips on a contact pad irrespective of the contact pad geometry and the character of the contact pad surface. For example, optical recognition of the surface of the contact pad is completed prior to contacting the contact pad by the contact element and generating a reference image. Optical recognition of the surface of the contact pad is completed after contacting of the contact pad by the contact element when generating the image to be analyzed. A difference between the reference image and the image to be analyzed is taken, and the resulting image is analyzed for recognized contrasts or impressions left by the contact element on the contact pad.

REFERENCES:
patent: 4786867 (1988-11-01), Yamatsu
patent: 5394100 (1995-02-01), Bohler et al.
patent: 6784678 (2004-08-01), Pietzschmann

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