Image analysis – Applications – Biomedical applications
Reexamination Certificate
2006-03-13
2008-08-12
Lu, Tom Y (Department: 2624)
Image analysis
Applications
Biomedical applications
Reexamination Certificate
active
07412085
ABSTRACT:
Methods for correcting systematic errors in the measured position of deposited features of a nucleic acid array on a substrate. Systematic errors are modeled by an algorithmic model based on measuring the positions (and possibly other properties) of a subset of the features, and a model is constructed for predicting deviations in feature position from an ideal grid. Deviations arising in the deposition process, the scanning process, or both may be corrected.
REFERENCES:
patent: 4707647 (1987-11-01), Coldren et al.
patent: 5581487 (1996-12-01), Kelly et al.
patent: 5721435 (1998-02-01), Troll
patent: 5744305 (1998-04-01), Fodor et al.
patent: 5801970 (1998-09-01), Rowland et al.
patent: 5812272 (1998-09-01), King et al.
patent: 5834758 (1998-11-01), Trulson et al.
patent: 5837475 (1998-11-01), Dorsel et al.
patent: 5861242 (1999-01-01), Chee et al.
patent: WO 99/08233 (1999-02-01), None
patent: WO 01/06395 (2001-01-01), None
A. Kulkin et al., Title: “High Throughput Screening Of Gene Expression Signatures”, 2000, Genetica 108, pp. 41-46.
R.C.Y. Cheung & Christopher J.S. deSilva, “Analysis Of Gene Microarray Images”, 1999, IEEE, pp. 627-632.
Cattell Herbert F.
Dorsel Andreas N.
Sadler John W.
Sampas Nicholas M.
Agilent Technologie,s Inc.
Lu Tom Y
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