Spectroscope

Details Spectroscope Spectroscope

2005-12-08

2008-10-14

Evans, F. L (Department: 2877)

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

Reexamination Certificate

active

07436512

ABSTRACT:
A spectroscope is described comprising an incident slit, a collimator lens type optical system that makes the light rays having passed through the incident slit parallel light rays, a reflection type diffraction grating that receives the parallel light rays and, according to the wavelength, outputs these light rays at different angles, a condenser lens type optical system that condenses the output light from the diffraction grating, and a two-dimensional detector having a two-dimensional light-receiving surface that detects the light rays that have been condensed by the condenser lens type optical system.

REFERENCES:
patent: 4375919 (1983-03-01), Busch
patent: 4678332 (1987-07-01), Rock et al.
patent: 5080486 (1992-01-01), Shirasaki et al.
patent: 2003/0071993 (2003-04-01), Zhao et al.
patent: 19728966 (1998-10-01), None
Japanese Patent Abstract Publication No. 2003-042846 for “High-Resolution Aberration Correction Spectroscope,” published Feb. 13, 2003.
Espace Patent Abstract for JP2001013006, published Jan. 19, 2001.
Japanese Patent Abstract Publication No. 2003-042846, published Feb. 13, 2003, entitled “High-Resolution Aberration Correction Spectroscope,” one page.

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