On-wafer test structures for differential signals

Details On-wafer test structures for differential signals On-wafer test structures for differential signals

2007-03-09

2008-10-28

Nguyen, Ha (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

07443186

ABSTRACT:
A test structure for characterizing integrated circuits on a wafer includes a differential cell outputting a differential mode signal in response to a differential mode input signal. The probe pads of the test structure are arrayed linearly enabling placement of the test structure in a saw street between dies.

REFERENCES:
patent: 491783 (1893-02-01), Moyer
patent: 1337866 (1920-04-01), Whitacker
patent: 2142625 (1939-01-01), Zoethout
patent: 2376101 (1945-05-01), Tyzzer
patent: 2389668 (1945-11-01), Johnson
patent: 2545258 (1951-03-01), Cailloux
patent: 2762234 (1956-09-01), Dodd
patent: 2901696 (1959-08-01), Möllfors
patent: 2921276 (1960-01-01), Fubini
patent: 6176091 (1965-03-01), Hanson et al.
patent: 3193712 (1965-07-01), Harris
patent: 3218584 (1965-11-01), Ayer
patent: 3230299 (1966-01-01), Radziekowski
patent: 3262593 (1966-07-01), Hainer
patent: 3396598 (1968-08-01), Grispo
patent: 3401126 (1968-09-01), Miller et al.
patent: 3429040 (1969-02-01), Miller
patent: 3445770 (1969-05-01), Harmon
patent: 3484679 (1969-12-01), Hodgson et al.
patent: 3541222 (1970-11-01), Parks et al.
patent: 3561280 (1971-02-01), MacPhee et al.
patent: 3573617 (1971-04-01), Randolph et al.
patent: 3596228 (1971-07-01), Reed et al.
patent: 3609539 (1971-09-01), Gunthert
patent: 3611199 (1971-10-01), Safran
patent: 3619780 (1971-11-01), Hoeks
patent: 3622915 (1971-11-01), Davo
patent: 3634807 (1972-01-01), Grobe et al.
patent: 3648169 (1972-03-01), Wiesler
patent: 3654585 (1972-04-01), Wickersham
patent: 3662318 (1972-05-01), Decuyper
patent: 3680037 (1972-07-01), Nellis et al.
patent: 3686624 (1972-08-01), Napoli et al.
patent: 3700998 (1972-10-01), Lee et al.
patent: 3705379 (1972-12-01), Bogar
patent: 3710251 (1973-01-01), Hagge et al.
patent: 3714572 (1973-01-01), Ham et al.
patent: 3725829 (1973-04-01), Brown
patent: 3740900 (1973-06-01), Youmans et al.
patent: 3766470 (1973-10-01), Hay et al.
patent: 3806801 (1974-04-01), Bove
patent: 3810016 (1974-05-01), Chayka et al.
patent: 3829076 (1974-08-01), Sofy
patent: 3833852 (1974-09-01), Schoch
patent: 3839672 (1974-10-01), Anderson
patent: 3849728 (1974-11-01), Evans
patent: 3858212 (1974-12-01), Tompkins et al.
patent: 3862790 (1975-01-01), Davies et al.
patent: 3866093 (1975-02-01), Kusters et al.
patent: 3867698 (1975-02-01), Beltz et al.
patent: 3930809 (1976-01-01), Evans
patent: 3936743 (1976-02-01), Roch
patent: 3952156 (1976-04-01), Lahr
patent: 3970934 (1976-07-01), Aksu
patent: 3971610 (1976-07-01), Buchoff et al.
patent: 3976959 (1976-08-01), Gaspari
patent: 3992073 (1976-11-01), Buchoff et al.
patent: 4001685 (1977-01-01), Roch
patent: 4008900 (1977-02-01), Khoshaba
patent: 4009456 (1977-02-01), Hopfer
patent: 4027935 (1977-06-01), Byrnes et al.
patent: 4035723 (1977-07-01), Kvaternik
patent: 4038599 (1977-07-01), Bove et al.
patent: 4038894 (1977-08-01), Knibbe et al.
patent: 4049252 (1977-09-01), Bell
patent: 4063195 (1977-12-01), Abrams et al.
patent: 4066943 (1978-01-01), Roch
patent: 4072576 (1978-02-01), Arwin et al.
patent: 4074201 (1978-02-01), Lennon
patent: 4093988 (1978-06-01), Scott
patent: 4099120 (1978-07-01), Aksu
patent: 4115735 (1978-09-01), Stanford
patent: 4116523 (1978-09-01), Coberly
patent: 4123706 (1978-10-01), Roch
patent: 4124787 (1978-11-01), Aamoth et al.
patent: 4135131 (1979-01-01), Larsen et al.
patent: 4151465 (1979-04-01), Lenz
patent: 4161692 (1979-07-01), Tarzwell
patent: 4177421 (1979-12-01), Thornburg
patent: 4184133 (1980-01-01), Gehle
patent: 4184729 (1980-01-01), Parks et al.
patent: 4216467 (1980-08-01), Colston
patent: 4225819 (1980-09-01), Grau et al.
patent: 4232398 (1980-11-01), Gould et al.
patent: 4251772 (1981-02-01), Worsham et al.
patent: 4275446 (1981-06-01), Blaess
patent: 4277741 (1981-07-01), Faxvog et al.
patent: 4280112 (1981-07-01), Eisenhart
patent: 4284033 (1981-08-01), del Rio
patent: 4284682 (1981-08-01), Frosch et al.
patent: 4287473 (1981-09-01), Sawyer
patent: 4302146 (1981-11-01), Finlayson et al.
patent: 4306235 (1981-12-01), Christmann
patent: 4312117 (1982-01-01), Robillard et al.
patent: 4327180 (1982-04-01), Chen
patent: 4330783 (1982-05-01), Toia
patent: 4340860 (1982-07-01), Teeple, Jr.
patent: 4346355 (1982-08-01), Tsukii
patent: 4357575 (1982-11-01), Uren et al.
patent: 4375631 (1983-03-01), Goldberg
patent: 4376920 (1983-03-01), Smith
patent: 4383217 (1983-05-01), Shiell
patent: 4401945 (1983-08-01), Juengel
patent: 4425395 (1984-01-01), Negishi et al.
patent: 4453142 (1984-06-01), Murphy
patent: 4468629 (1984-08-01), Choma, Jr.
patent: 4487996 (1984-12-01), Rabinowitz et al.
patent: 4515133 (1985-05-01), Roman
patent: 4515439 (1985-05-01), Esswein
patent: 4528504 (1985-07-01), Thornton, Jr. et al.
patent: 4552033 (1985-11-01), Marzhauser
patent: 4567321 (1986-01-01), Harayama
patent: 4588950 (1986-05-01), Henley
patent: 4621169 (1986-11-01), Petinelli et al.
patent: 4626618 (1986-12-01), Takaoka et al.
patent: 4641659 (1987-02-01), Sepponen
patent: 4642417 (1987-02-01), Ruthrof et al.
patent: 4646005 (1987-02-01), Ryan
patent: 4649339 (1987-03-01), Grangroth et al.
patent: 4651115 (1987-03-01), Wu
patent: 4652082 (1987-03-01), Warner
patent: 4663840 (1987-05-01), Ubbens et al.
patent: 4669805 (1987-06-01), Kosugi et al.
patent: 4673839 (1987-06-01), Veenendaal
patent: 4684883 (1987-08-01), Ackerman et al.
patent: 4684884 (1987-08-01), Soderlund
patent: 4685150 (1987-08-01), Maier
patent: 4691163 (1987-09-01), Blass et al.
patent: 4696544 (1987-09-01), Costella
patent: 4697143 (1987-09-01), Lockwood et al.
patent: 4705447 (1987-11-01), Smith
patent: 4706050 (1987-11-01), Andrews
patent: 4707657 (1987-11-01), Bøegh-Petersen
patent: 4711563 (1987-12-01), Lass
patent: 4713347 (1987-12-01), Mitchell et al.
patent: 4714873 (1987-12-01), McPherson et al.
patent: 4722846 (1988-02-01), Abe et al.
patent: 4725793 (1988-02-01), Igarashi
patent: 4727319 (1988-02-01), Shahriary
patent: 4727391 (1988-02-01), Tajima et al.
patent: 4727637 (1988-03-01), Buckwitz et al.
patent: 4734641 (1988-03-01), Byrd, Jr. et al.
patent: 4739259 (1988-04-01), Hadwin et al.
patent: 4740764 (1988-04-01), Gerlack
patent: 4742571 (1988-05-01), Letron
patent: 4744041 (1988-05-01), Strunk et al.
patent: 4746857 (1988-05-01), Sakai et al.
patent: 4749942 (1988-06-01), Sang et al.
patent: 4754239 (1988-06-01), Sedivec
patent: 4755746 (1988-07-01), Mallory et al.
patent: 4755747 (1988-07-01), Sato
patent: 4755874 (1988-07-01), Esrig et al.
patent: 4757255 (1988-07-01), Margozzi
patent: 4764723 (1988-08-01), Strid
patent: 4766384 (1988-08-01), Kleinberg et al.
patent: 4772846 (1988-09-01), Reeds
patent: 4780670 (1988-10-01), Cherry
patent: 4783625 (1988-11-01), Harry et al.
patent: 4788851 (1988-12-01), Brault
patent: 4791363 (1988-12-01), Logan
patent: 4793814 (1988-12-01), Zifcak et al.
patent: 4795962 (1989-01-01), Yanagawa et al.
patent: 4805627 (1989-02-01), Klingenbeck et al.
patent: 4810981 (1989-03-01), Herstein
patent: 4812754 (1989-03-01), Tracy et al.
patent: 4818059 (1989-04-01), Kakii et al.
patent: 4827211 (1989-05-01), Strid et al.
patent: 4831494 (1989-05-01), Arnold et al.
patent: 4835495 (1989-05-01), Simonutti
patent: 4837507 (1989-06-01), Hechtman
patent: 4839587 (1989-06-01), Flatley et al.
patent: 4849689 (1989-07-01), Gleason et al.
patent: 4853624 (1989-08-01), Rabjohn
patent: 4853627 (1989-08-01), Gleason et al.
patent: 4858160 (1989-08-01), Strid et al.
patent: 4859989 (1989-08-01), McPherson
patent: 4864227 (1989-09-01), Sato
patent: 4871883 (1989-10-01), Guiol
patent: 4871964 (1989-10-01), Boll et al.
patent: 4888550 (1989-12-01), Reid
patent: 4891584 (1990-01-01), Kamieniecki et al.
patent: 4893914 (1990-01-01), Hancock et al.
patent: 4894612 (1990-01-01), Drake et al.
patent: 4899126 (1990-02-01), Yamada
patent: 4899998 (1990-02-01), Feramachi
patent: 4901012 (1990-02-01), Gloanec et al.
patent: 4904933 (1990-02-01), Snyder et al.
patent: 4904935 (1990-02-01), Calma et al.
patent: 4906920 (1990-03-01), Huff et al.
patent: 4908570 (1990-03-01), Gupta et al.
patent: 4912399 (1990-03-01), Greub et al.
patent: 4916002 (1990-04-01), Carver
patent: 4916398 (1990

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