Methods for measuring optical characteristics by...

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S239100

Reexamination Certificate

active

07435941

ABSTRACT:
Methods and systems for measuring and/or inspecting a characteristic of an optical article are provided. In one example, a method includes illuminating an optical article with a focused beam of light, detecting the light with a sensor after interacting with the optical article, determining a deflection angle of the beam of light, and determining a characteristic of the optical article based on the deflection angle. In one example, a system includes a light source, an optical element, and a sensor. The optical element focuses light from the light source to a reference location, the sensor detects the light from the reference location and generates signals associated with the intensity and position of the light received. A processor may receive the signals from the sensor and thereby determine a deflection angle of the light from the probe path.

REFERENCES:
patent: 3688235 (1972-08-01), Migeotte
patent: 4453827 (1984-06-01), Taboada
patent: 4952027 (1990-08-01), Saito et al.
patent: 5042952 (1991-08-01), Opsal et al.
patent: 5181080 (1993-01-01), Fanton et al.
patent: 5210592 (1993-05-01), Bretschneider
patent: 5737081 (1998-04-01), Freischlad
patent: 6034766 (2000-03-01), Sugiura et al.
patent: 6134011 (2000-10-01), Klein et al.
patent: 2002/0031290 (2002-03-01), Tsutsumi
patent: 2002/0048233 (2002-04-01), Ogasawara et al.
patent: 2003/0147327 (2003-08-01), Curtis et al.
patent: 2004/0027668 (2004-02-01), Ayres et al.
Ayres, M.R. et al. (Nov. 20, 2006). “Scanning Transmission Microscopy Using A Position-Sensitive Detector,”Applied Optics45(33):8410-8418.
Ayres, M.R. (2007). “Signal Modulation For Holographic Memories,” Doctor of Philosophy Thesis submitted to the Department of Electrical and Computer Engineering, Graduate School of the University of Colorado, 252 pages.
Frieden, B.R. (Jan. 1967). “Optical Transfer of the Three-Dimensional Object,”Journal of the Optical Society of America57(1):56-66.
Kawata, Y. et al. (May 10, 1996). “Differential Phase-Contrast Microscope With Split Detector for the Readout System of a Multilayered Optical Memory,”Applied Optics35(14):2466-2470.
Kogelnik, H. (Nov. 1969). “Coupled Wave Theory for Thick Hologram Gratings,”The Bell System Technical Journal48(9):2909-2947.
O'Byrne, J.W. et al. (1999). “Adaptive Optics in Confocal Microscopy,”World Scientific, six pages.
Sheppard, C.J.R. et al. (1977). “Image Formation in the Scanning Microscopes,”Optica Acta24(10):1051-1073.
Sheppard, C.J.R. et al. (Sep. 1978). “Depth of Field in the Scanning Microscope,”Optics Letters3(3):115-117.
Sheppard, C.J.R. et al. (Sep. 1989). “Three-Dimensional Imaging in a Microscope,”J. Opt. Soc. Am. A6(9):1260-1269.
Sheppard, C.J.R. et al. (Feb. 1994). “Three-Dimensional Transfer Functions for High-Aperture Systems,”J. Opt. Soc. Am. A11(2):593-598.
Streibl, N. (Feb. 1985). “Three-Dimensional Imaging by a Microscope,”J. Opt. Soc. Am. A2(2):121-127.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods for measuring optical characteristics by... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods for measuring optical characteristics by..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods for measuring optical characteristics by... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4001032

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.