Semiconductor memory device

Static information storage and retrieval – Floating gate – Particular biasing

Reexamination Certificate

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C365S185140, C365S185180

Reexamination Certificate

active

07411838

ABSTRACT:
A drive circuit22controls voltages applied to a substrate1, selection gates SG0and SG1, a local bit line LB2, and a control gate CGn. By respectively applying a negative voltage to the control gate CGn, a positive voltage to the selection gate SG0, a voltage lower than the voltage applied to the selection gate SG0to the selection gate SG1, and a positive voltage to the local bit line LB2, the drive circuit22controls so that electrons are selectively drawn out of a floating gate FG3to the local bit line LB2by F-N tunneling during writing operation. Sufficient operation margin is obtained even when memory cells are miniaturized.

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patent: 7052947 (2006-05-01), Ding
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patent: 2002/0145914 (2002-10-01), Ogura et al.
patent: 2005/0029577 (2005-02-01), Nishizaka et al.
patent: 2005/0207199 (2005-09-01), Chen et al.
patent: 2005/0207225 (2005-09-01), Chen et al.
patent: 2005-51227 (2005-02-01), None

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