Registers – Records – Particular code pattern
Reexamination Certificate
2005-01-28
2008-10-14
Kim, Ahshik (Department: 2876)
Registers
Records
Particular code pattern
C235S454000
Reexamination Certificate
active
07434740
ABSTRACT:
The invention relates to a method and an apparatus (4) for detecting the position of a sequence of markings (2) on a carrier (1) in relation to a detector (3) for detecting the markings (2). In accordance with one embodiment, the sequence of markings (2) detected by the detector are compared with at least one reference sequence (5) corresponding to the arrangement of the markings (2) on the carrier (1). In order to be able to reliably detect the position and rapidly identify errors, a comparison of a sensing sequence of markings (2) detected by the detector (3) with sections of the reference sequence (5) is carried out and an error signal is generated if the comparison does not result in complete correspondence. In this way, the function of the detector (3) can be checked particularly reliably. This method is advantageously implemented in a data processing device (4) that is present anyway, with the result that no additional components are required.
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Infineon - Technologies AG
Kim Ahshik
Maginot Moore & Beck
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