Circuit for and method of detecting a defect in a component...

Details Circuit for and method of detecting a defect in a component... Circuit for and method of detecting a defect in a component...

2005-01-10

2008-09-30

Nguyen, Ha (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S525000, C324S537000, C324S719000, C324S765010

Reexamination Certificate

active

07429867

ABSTRACT:
Various embodiments of the present invention describe circuits for and methods of detecting a defect in a component formed in a substrate of an integrated circuit. According to one embodiment, a circuit comprises a plurality of components formed in a substrate and coupled in series by a plurality of signal paths extending from a first end to a second end. An input signal coupled to the first end of the first signal path is detected a signal detector coupled to a second end of the first signal path to determine whether there is a defect in a component formed in the substrate. Switching networks at the inputs and the outputs of the plurality signal paths enable determining a particular signal path that had a defect. Alternate embodiments describe circuits for determining the location of a defective component in a signal path. Various methods of detecting defective components are also described.

REFERENCES:
patent: 3723864 (1973-03-01), Ricard
patent: 6281696 (2001-08-01), Voogel
patent: 6509739 (2003-01-01), Voogel et al.
patent: 6621289 (2003-09-01), Voogel
patent: 6727710 (2004-04-01), de Jong et al.
patent: 6765404 (2004-07-01), Gilliam
patent: 7227364 (2007-06-01), Fan et al.
patent: 2006/0022693 (2006-02-01), Bazan et al.

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