Method for optimizing the performance of a semiconductor...

Details Method for optimizing the performance of a semiconductor... Method for optimizing the performance of a semiconductor...

2006-06-22

2008-05-27

Rose, Kiesha (Department: 4176)

Radiant energy

Invisible radiant energy responsive electric signalling

Semiconductor system

C378S147000

Reexamination Certificate

active

07378663

ABSTRACT:
This method for optimizing the performance of a semiconductor detector intended to detect electromagnetic radiation, especially X-rays or γ rays, equipped with electrodes separately mounted on two opposite surfaces of said detector, namely a cathode and a pixelated anode respectively, involves (i) determining the signal that is representative of the sum of the charges detected by all or some of the anodes; and (ii) using the signal that is representative of said sum of the charges to establish one or more biparametric spectra as a function of this signal so as to determine any charge collection loss if charge sharing occurred on the pixelated anodes and, consequently, performing appropriate processing depending on the type of result desired.

REFERENCES:
patent: 6329651 (2001-12-01), Mestais et al.
patent: 2002/0036269 (2002-03-01), Shahar et al.
patent: 2 790 560 (2000-09-01), None
Verger, L. et al., “Performance and Perspectives of a Gamma Camera Based on CdZnTe for Medical Imaging, ” 2003 IEEE Nuclear Science Symposium Conference Record / 2003 IEEE Nuclear Science Symposium and Medical Imaging Conference. Portland, OR, Oct. 19-25, 2003, IEEE Nuclear Science Symposium Conference Record, New York, NY : IEEE, US, vol. 5 of 5, Oct. 19, 2003, pp. 3324-3330.

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