Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-12-08
2008-03-11
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S763010, C324S762010
Reexamination Certificate
active
07342406
ABSTRACT:
A method of measuring variability of integrated circuit components is provided. A specified parameter of at least one first array configuration comprising a plurality of the integrated circuit components without specified internal connections between the integrated circuit components is measured. The specified parameter of at least one second array configuration comprising a plurality of the integrated circuit components nominally identical to those of the first array configuration with specified internal connections between the integrated circuit components is also measured. A variation coefficient is determined for the integrated circuit components based on the measured specified parameter of the at least one first array configuration and the at least one second array configuration.
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K. Terada et al., entitled “A Test Circuit for Measuring MOSFET Threshold Voltage Mismatch,” Microelectronic Test Structures, International Conference, pp. 227-231, 2003.
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Bhushan Manjul
Gettings Karen M. G. V.
Haensch Wilfried E.
Ji Brian L.
Ketchen Mark B.
Ryan & Mason & Lewis, LLP
Tang Minh N.
Tuchman Ido
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