Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-07-17
2008-03-18
Nguyen, Vinh P. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB
Reexamination Certificate
active
07345497
ABSTRACT:
A protection circuit comprises: at least one shielded line arranged to cover an area to be protected over a semiconductor device, the at least one shielded line having only one route from a start point to an end point; a signal generator for applying a signal to the start point of the shielded line; a counter which starts measurement of time in response to application of the signal to the start point of the shielded line by the signal generator and which ends measurement of the time in response to arrival of the signal at the end point of the shielded line; and a comparator for comparing the time measured by the counter with a reference value to output a fraud detection signal according to a result of the comparison.
REFERENCES:
patent: 5406630 (1995-04-01), Piosenka et al.
patent: 5675645 (1997-10-01), Schwartz et al.
patent: 5892369 (1999-04-01), Sourgen et al.
patent: 5986284 (1999-11-01), Kusaba et al.
patent: 6496119 (2002-12-01), Otterstedt et al.
patent: 7080001 (2006-07-01), Moriyama et al.
patent: 7088124 (2006-08-01), Cohn et al.
patent: 2002/0126792 (2002-09-01), Fuhrmann et al.
patent: 58-209136 (1983-12-01), None
patent: 05-047766 (1993-02-01), None
patent: 5-167020 (1993-07-01), None
patent: 2001-141783 (2001-05-01), None
patent: 2001-144255 (2001-05-01), None
patent: 2001-166009 (2001-06-01), None
patent: 2001-177064 (2001-06-01), None
patent: 2001-244414 (2001-09-01), None
patent: 2002-529928 (2002-09-01), None
Matsushita Electric - Industrial Co., Ltd.
McDermott Will & Emery LLP
Nguyen Vinh P.
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