Probe cards employing probes having retaining portions for...

Details Probe cards employing probes having retaining portions for... Probe cards employing probes having retaining portions for...

2005-12-14

2008-03-18

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07345492

ABSTRACT:
Method and apparatus using a retention arrangement with a potting enclosure for holding a plurality of probes by their retention portions, the probes being of the type having contacting tips for establishing electrical contact with pads or bumps of a device under test (DUT) to perform an electrical test. The retention arrangement has a top plate with top openings for the probes, a bottom plate with bottom openings for the probes, the plates being preferably made of ceramic with laser-machined openings, and a potting enclosure between the plates for admitting a potting agent that upon curing pots the retaining portions of the probes. In some embodiments a spacer is positioned between the top and bottom plates for defining the potting enclosure. Alternatively, the retention arrangement has intermediate plates located in the potting enclosure and having probe guiding openings to guide the probes.

REFERENCES:
patent: 5936421 (1999-08-01), Stowers et al.
patent: 6066957 (2000-05-01), Van Loan et al.
patent: 6566898 (2003-05-01), Theissen et al.
patent: 6586955 (2003-07-01), Fjelstad et al.
patent: 6881974 (2005-04-01), Wood et al.
patent: 2002/0000815 (2002-01-01), Fjelstad et al.
patent: 2002/0117330 (2002-08-01), Eldridge et al.

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