Semiconductor apparatus and test execution method for...

Details Semiconductor apparatus and test execution method for... Semiconductor apparatus and test execution method for...

2007-05-14

2008-03-18

Pert, Evan (Department: 2826)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07345496

ABSTRACT:
A semiconductor apparatus includes a reset terminal to input a reset control signal to reset an internal circuit, a reset detector to generate a reset clear signal to clear a reset of the internal circuit according to the input reset control signal and a mode capture unit to retain a test mode to test an operation of the internal circuit according to a signal input to the reset terminal.

REFERENCES:
patent: 2000-304831 (2000-11-01), None

Affiliated with

Also associated with

Rating

Semiconductor apparatus and test execution method for... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor apparatus and test execution method for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor apparatus and test execution method for... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3977159