Semiconductor device incorporating characteristic evaluating...

Details Semiconductor device incorporating characteristic evaluating... Semiconductor device incorporating characteristic evaluating...

2005-03-23

2008-03-04

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S1540PB, C714S733000, C714S734000

Reexamination Certificate

active

07339389

ABSTRACT:
In a semiconductor device, a main circuit is operated by a first clock signal, and at least one characteristic evaluating circuit is operated by a second clock signal whose frequency is higher than a frequency of the first clock signal. Also, at least one deterioration detecting circuit is connected to the characteristic evaluating circuit and Is adapted to detect deterioration of the characteristic evaluating circuit.

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